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Home > High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Author

R. Dean Adams

Series

Frontiers in Electronic Testing

Volume

22A

Year of Publication

2003

Publisher

Springer US

City of Publication

Boston

Pages

XIV, 250

Language

en

ISBN

9781402072550, 9780306479724, 1402072554

ARI Id

1664071073486

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Topics
Computer storage devices Semiconductor storage devices Testing