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Home > Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse: Tübingen, September 9th–14th, 1968

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse: Tübingen, September 9th–14th, 1968


Book Informaton

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse: Tübingen, September 9th–14th, 1968

Author

Gottfried Möllenstedt; K.H. Gaukler

Year of Publication

1969

Publisher

Springer Berlin Heidelberg

City of Publication

Berlin; New York

Pages

XII, 612

Language

de

ISBN

9783540045717, 9783662121085, 9783662121108

ARI Id

1664315830767


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