Home > Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979
Book Informaton
Author
A. Benninghoven; C.A. Jr. Evans; R.A. Powell; R. Shimizu; H.A. Storms
Series
Springer Series in Chemical Physics
Year of Publication
1979
Publisher
Springer Berlin Heidelberg
Pages
XIV, 300
Language
EN
ISBN
9783540098430, 9783642618710
ARI Id
1664385146027
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Showing 1 to 20 of 100 entries