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Home > Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979

Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979


Book Informaton

Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979

Author

A. Benninghoven; C.A. Jr. Evans; R.A. Powell; R. Shimizu; H.A. Storms

Series

Springer Series in Chemical Physics

Year of Publication

1979

Publisher

Springer Berlin Heidelberg

Pages

XIV, 300

Language

EN

ISBN

9783540098430, 9783642618710

ARI Id

1664385146027


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