Home > Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Book Informaton
Author
José Pineda de Gyvez
Series
The Springer International Series in Engineering and Computer Science
Volume
208
Year of Publication
1993
Publisher
Springer US
City of Publication
Boston
Pages
XXIV, 167
Language
en
ISBN
9780792393061, 9781461531586, 0792393066
ARI Id
1664601644631
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