Home > Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983
Book Informaton
Author
A. Benninghoven; J. Okano; R. Shimizu; H.W. Werner
Series
Springer Series in Chemical Physics
Volume
36
Year of Publication
1984
Publisher
Springer Berlin Heidelberg
City of Publication
Berlin, Heidelberg
Pages
XVI, 506
Language
en
ISBN
9783540133162, 9783642822568, 3642822584, 9783642822582
ARI Id
1664619052263
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