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Home > Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983

Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983


Book Informaton

Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983

Author

A. Benninghoven; J. Okano; R. Shimizu; H.W. Werner

Series

Springer Series in Chemical Physics

Volume

36

Year of Publication

1984

Publisher

Springer Berlin Heidelberg

City of Publication

Berlin, Heidelberg

Pages

XVI, 506

Language

en

ISBN

9783540133162, 9783642822568, 3642822584, 9783642822582

ARI Id

1664619052263


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