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Home > X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987

X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987


Book Informaton

X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987

Author

David Sayre; Malcolm Howells; Janos Kirz; Harvey Rarback

Series

Springer Series in Optical Sciences

Volume

56

Year of Publication

1988

Publisher

Springer Berlin Heidelberg

City of Publication

Berlin, Heidelberg

Pages

XIV, 455

Language

EN

ISBN

9783540193920, 9783540392460, 3540392467

ARI Id

1664695551878


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