Home > X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987
Book Informaton
Author
David Sayre; Malcolm Howells; Janos Kirz; Harvey Rarback
Series
Springer Series in Optical Sciences
Volume
56
Year of Publication
1988
Publisher
Springer Berlin Heidelberg
City of Publication
Berlin, Heidelberg
Pages
XIV, 455
Language
EN
ISBN
9783540193920, 9783540392460, 3540392467
ARI Id
1664695551878
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