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CMOS RF Circuit Design for Reliability and Variability

Book Informaton
CMOS RF Circuit Design for Reliability and Variability

Author

Jiann-Shiun Yuan

Series

SpringerBriefs in Applied Sciences and Technology

Year of Publication

1st ed. 2016

Publisher

Springer Nature Singapore

Pages

VI, 106

Language

en

ISBN

9789811008825, 9789811008849

ARI Id

1664855275691

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Metal oxide semiconductors complementary