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Home > Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach

Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach


Book Informaton

Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach

Author

Nicholas D. Kay

Series

Springer Theses

Year of Publication

1st ed. 2018

Publisher

Springer International Publishing

Pages

XXI, 122

Language

en

ISBN

9783319701806, 9783319701813, 3319701800

ARI Id

1665090772726


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