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Home > Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings


Book Informaton

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings

Author

Xiao Bai; Edwin R. Hancock; Tin Kam Ho; Richard C. Wilson; Battista Biggio; Antonio Robles-Kelly

Series

Lecture Notes in Computer Science

Volume

11004

Year of Publication

1st ed. 2018

Publisher

Springer International Publishing

Pages

XIII, 524

Language

en

ISBN

9783319977843, 9783319977850, 3319977849

ARI Id

1665135678126


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