Home > Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Book Informaton
Author
Xiao Bai; Edwin R. Hancock; Tin Kam Ho; Richard C. Wilson; Battista Biggio; Antonio Robles-Kelly
Series
Lecture Notes in Computer Science
Volume
11004
Year of Publication
1st ed. 2018
Publisher
Springer International Publishing
Pages
XIII, 524
Language
en
ISBN
9783319977843, 9783319977850, 3319977849
ARI Id
1665135678126
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