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VLSI Reliability

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VLSI Reliability

Author

Anant G. Sabnis

Series

VLSI Electronics Microstructure Science

Volume

22

Year of Publication

1990

Publisher

Elsevier

City of Publication

San Diego

Pages

207

Language

en

ISBN

9780122341229, 0122341228

ARI Id

1665472962721

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Topics
Integrated circuits Reliability Very large scale integration