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Nanometer-scale Defect Detection Using Polarized Light

Book Informaton
Nanometer-scale Defect Detection Using Polarized Light

Author

Pierre Richard Dahoo

Edition

1st Edition

Year of Publication

2016

Publisher

John Wiley & Sons

Pages

316

Language

en

ISBN

1848219369, 1119329639, 1119329655, 9781848219366, 9781119329633, 9781119329657

ARI Id

1668228734738

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Topics
Chemical processes