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Home > Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach


Book Informaton

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

Author

Y. Sun, Yichuang Sun

Series

Circuits, Devices and Systems

Year of Publication

2007

Publisher

IET

Language

en

ISBN

0863417450, 9780863417450

ARI Id

1672220977614


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Showing 1 to 20 of 69 entries
Chapters/HeadingsAuthor(s)PagesInfo
List of contributors
11 Introduction
12 Multiple-fault diagnosis of linear circuits
13 Class-fault diagnosis of analogue circuits
14 Fault diagnosis of non-linear circuits
15 Recent advances in fault diagnosis of analogue circuits
16 Summary
17 References
21 Introduction
22 Symbolic analysis
23 Testability and ambiguity groups
24 Fault diagnosis of linear analogue circuits
25 Fault diagnosis of non-linear circuits
27 References
31 Introduction
32 Fault diagnosis of analogue circuits with tolerances using artificial neural networks
33 Wavelet-based neural-network technique for fault diagnosis of analogue circuits with noise
34 Neural-network-based L1-norm optimization approach for fault diagnosis of non-linear circuits
35 Summary
36 References
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 69 entries