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Home > Microelectronic manufacturing yield, reliability, and failure analysis: 25-26 October, 1995, Austin, Texas /

Microelectronic manufacturing yield, reliability, and failure analysis: 25-26 October, 1995, Austin, Texas /


Book Informaton

Microelectronic manufacturing yield, reliability, and failure analysis: 25-26 October, 1995, Austin, Texas /

Author

Rao, Gopal K.; Piccoli, Massimo.

Series

Proceedings / SPIE--the International Society for Optical Engineering;

Volume

v. 2635

Year of Publication

[1995], ©1995.

Publisher

SPIE,

City of Publication

Bellingham, Wash., USA

Pages

284

Language

en

ISBN

0819420018

ARI Id

1675053253281


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