Home > Microelectronic manufacturing yield, reliability, and failure analysis: 25-26 October, 1995, Austin, Texas /
Microelectronic manufacturing yield, reliability, and failure analysis: 25-26 October, 1995, Austin, Texas /
Book Informaton
Author
Rao, Gopal K.; Piccoli, Massimo.
Series
Proceedings / SPIE--the International Society for Optical Engineering;
Volume
v. 2635
Year of Publication
[1995], ©1995.
Publisher
SPIE,
City of Publication
Bellingham, Wash., USA
Pages
284
Language
en
ISBN
0819420018
ARI Id
1675053253281
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