Home > Forensic evidence analysis and crime scene investigation: 20-21 November, 1996, Boston, Massachusetts /
Forensic evidence analysis and crime scene investigation: 20-21 November, 1996, Boston, Massachusetts /
Book Informaton
Author
Hicks, John, ; De Forest, Peter R.; Baylor, Vivian M.
Series
Proceedings / SPIE--the International Society for Optical Engineering;
Volume
v. 2941
Year of Publication
[1997], ©1997.
Publisher
SPIE,
City of Publication
Bellingham, Wash., USA
Pages
148
Language
en
ISBN
0819423432
ARI Id
1675159590125
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