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Home > Forensic evidence analysis and crime scene investigation: 20-21 November, 1996, Boston, Massachusetts /

Forensic evidence analysis and crime scene investigation: 20-21 November, 1996, Boston, Massachusetts /


Book Informaton

Forensic evidence analysis and crime scene investigation: 20-21 November, 1996, Boston, Massachusetts /

Author

Hicks, John, ; De Forest, Peter R.; Baylor, Vivian M.

Series

Proceedings / SPIE--the International Society for Optical Engineering;

Volume

v. 2941

Year of Publication

[1997], ©1997.

Publisher

SPIE,

City of Publication

Bellingham, Wash., USA

Pages

148

Language

en

ISBN

0819423432

ARI Id

1675159590125


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