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Home > Three-dimensional imaging and laser-based systems for metrology and inspection II: 20-21 November, 1996, Boston, Massachusetts /

Three-dimensional imaging and laser-based systems for metrology and inspection II: 20-21 November, 1996, Boston, Massachusetts /


Book Informaton

Three-dimensional imaging and laser-based systems for metrology and inspection II: 20-21 November, 1996, Boston, Massachusetts /

Author

Harding, Kevin G.; Svetkoff, Donald J.

Series

Proceedings / SPIE--the International Society for Optical Engineering;

Volume

v. 2909

Year of Publication

[1996], ©1996.

Publisher

SPIE,

City of Publication

Bellingham, Wash

Pages

282

Language

en

ISBN

0819423114

ARI Id

1675161832955


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