Home > Integrating photogrammetric techniques with scene analysis and machine vision III: 21-23 April, 1997, Orlando, Florida /
Integrating photogrammetric techniques with scene analysis and machine vision III: 21-23 April, 1997, Orlando, Florida /
Book Informaton
Author
McKeown, David M.; McGlone, J. Chris.; Jamet, Olivier.
Series
Proceedings / SPIE--the International Society for optical Engineering;
Volume
v. 3072
Year of Publication
[1997], ©1997.
Publisher
SPIE,
City of Publication
Bellingham, Washington
Pages
338
Language
en
ISBN
0819424870
ARI Id
1675203678728
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