Home > Microelectronic manufacturing yield, reliability, and failure analysis IV: 23-24 September, 1998, Santa Clara, California /
Microelectronic manufacturing yield, reliability, and failure analysis IV: 23-24 September, 1998, Santa Clara, California /
Book Informaton
Author
Prasad, Sharad.; Hartmann, Hans-Dieter.; Tsujide, Tohru.
Series
SPIE proceedings series;
Volume
v. 3510
Year of Publication
[1998], ©1998.
Publisher
SPIE,
City of Publication
Bellingham, Washington
Pages
240
Language
en
ISBN
0819429694
ARI Id
1675360864703
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