Search from the table of contents of 2.5 million books
Advanced Search (Beta)
Home > Microelectronic manufacturing yield, reliability, and failure analysis IV: 23-24 September, 1998, Santa Clara, California /

Microelectronic manufacturing yield, reliability, and failure analysis IV: 23-24 September, 1998, Santa Clara, California /


Book Informaton

Microelectronic manufacturing yield, reliability, and failure analysis IV: 23-24 September, 1998, Santa Clara, California /

Author

Prasad, Sharad.; Hartmann, Hans-Dieter.; Tsujide, Tohru.

Series

SPIE proceedings series;

Volume

v. 3510

Year of Publication

[1998], ©1998.

Publisher

SPIE,

City of Publication

Bellingham, Washington

Pages

240

Language

en

ISBN

0819429694

ARI Id

1675360864703


Find on

World Cat

OpenLibrary

Internet Archive


This page has been accessed 5 times.
Asian Research Index Whatsapp Chanel
Asian Research Index Whatsapp Chanel

Join our Whatsapp Channel to get regular updates.

Citation Options
Download Citation

Showing 1 to 20 of 28 entries
Chapters/HeadingsAuthor(s)PagesInfo
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 28 entries