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Home > 2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada: proceedings /

2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada: proceedings /


Book Informaton

2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada: proceedings /

Author

Malaiya, Yashwant K.; Sachdev, Manoj.; Menon, Sankaran M.

Year of Publication

[2000], ©2000.

Publisher

IEEE Computer Society,

City of Publication

Los Alamitos, Calif

Pages

82

Language

en

ISBN

0769506372

ARI Id

1675446432652


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