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Home > Test, measurement, and characterization of high speed digital components and systems: 59th ARFTG Conference digest: Spring 2002, June 7th, 2002, Seattle, Washington, Automatic RF Techniques Group.

Test, measurement, and characterization of high speed digital components and systems: 59th ARFTG Conference digest: Spring 2002, June 7th, 2002, Seattle, Washington, Automatic RF Techniques Group.


Book Informaton

Test, measurement, and characterization of high speed digital components and systems: 59th ARFTG Conference digest: Spring 2002, June 7th, 2002, Seattle, Washington, Automatic RF Techniques Group.

Author

Automatic RF Techniques Group. (59th 2002 Seattle, Wash.)

Year of Publication

[2002], ©2002.

Publisher

IEEE,

City of Publication

Piscataway, NJ

Pages

220

Language

en

ISBN

0780371437

ARI Id

1675549185024


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