Home > Testing, reliability, and application of micro- and nano-material systems: 3-5 March, 2003, San Diego, California /
Testing, reliability, and application of micro- and nano-material systems: 3-5 March, 2003, San Diego, California /
Book Informaton
Author
Meyendorf, Norbert.; Baaklini, George Y.; Michel, Bernd,
Series
SPIE proceedings series;
Volume
v. 5045
Year of Publication
[2003], ©2003.
Publisher
SPIE,
City of Publication
Bellingham, Wash
Pages
296
Language
en
ISBN
0819448508
ARI Id
1675553125018
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