Search from the table of contents of 2.5 million books
Advanced Search (Beta)
Home > Advanced characterization techniques for optics, semiconductors, and nanotechnologies: 3-5 August 2003, San Diego, California, USA /

Advanced characterization techniques for optics, semiconductors, and nanotechnologies: 3-5 August 2003, San Diego, California, USA /


Book Informaton

Advanced characterization techniques for optics, semiconductors, and nanotechnologies: 3-5 August 2003, San Diego, California, USA /

Author

Duparré, Angela.; Singh, Bhanwar.

Series

SPIE proceedings series,

Volume

v. 5188

Year of Publication

[2003], ©2003.

Publisher

SPIE,

City of Publication

Bellingham, Wash., USA

Pages

402

Language

en

ISBN

0819450618

ARI Id

1675601066160


Find on

World Cat

OpenLibrary

Internet Archive


This page has been accessed 5 times.
Asian Research Index Whatsapp Chanel
Asian Research Index Whatsapp Chanel

Join our Whatsapp Channel to get regular updates.

Citation Options
Download Citation

Showing 1 to 20 of 40 entries
Chapters/HeadingsAuthor(s)PagesInfo
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 40 entries