Search from the table of contents of 2.5 million books
Advanced Search (Beta)
Home > Reliability, testing, and characterization of MEMS/MOEMS III: 26-28 January, 2004, San Jose, California, USA /

Reliability, testing, and characterization of MEMS/MOEMS III: 26-28 January, 2004, San Jose, California, USA /


Book Informaton

Reliability, testing, and characterization of MEMS/MOEMS III: 26-28 January, 2004, San Jose, California, USA /

Author

Tanner, Danelle Mary, ; Ramesham, Rajeshuni.

Series

SPIE proceedings series;

Volume

v. 5343

Year of Publication

[2004], ©2004.

Publisher

SPIE,

City of Publication

Bellingham, Wash

Pages

312

Language

en

ISBN

0819452513

ARI Id

1675614906851


Find on

World Cat

OpenLibrary

Internet Archive


This page has been accessed 4 times.
Asian Research Index Whatsapp Chanel
Asian Research Index Whatsapp Chanel

Join our Whatsapp Channel to get regular updates.

Citation Options
Download Citation

Showing 1 to 20 of 37 entries
Chapters/HeadingsAuthor(s)PagesInfo
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 37 entries