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Home > Two- and three-dimensional vision systems for inspection, control, and metrology: 29-30 October 2003, Providence, Rhode Island, USA /

Two- and three-dimensional vision systems for inspection, control, and metrology: 29-30 October 2003, Providence, Rhode Island, USA /


Book Informaton

Two- and three-dimensional vision systems for inspection, control, and metrology: 29-30 October 2003, Providence, Rhode Island, USA /

Author

Batchelor, Bruce G.; Hügli, Heinz.

Series

SPIE proceedings series;

Volume

v. 5265

Year of Publication

[2004], ©2004.

Publisher

SPIE,

City of Publication

Bellingham, Wash. USA

Pages

228

Language

en

ISBN

0819451533

ARI Id

1675618251552


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