Search from the table of contents of 2.5 million books
Advanced Search (Beta)
Home > Materials, processes, integration and reliability in advanced interconects for micro- and nanoelectronics: symposium held April 10-12, 2007, San Francisco, California, U. S. A. /

Materials, processes, integration and reliability in advanced interconects for micro- and nanoelectronics: symposium held April 10-12, 2007, San Francisco, California, U. S. A. /


Book Informaton

Materials, processes, integration and reliability in advanced interconects for micro- and nanoelectronics: symposium held April 10-12, 2007, San Francisco, California, U. S. A. /

Author

Lin, Qinghuang,

Series

Materials Research Society symposium proceedings,

Volume

v. 990

Year of Publication

c2007.

Publisher

Materials Research Society,

City of Publication

United States

Pages

338

Language

en

ISBN

9781558999503, 1558999507

ARI Id

1675693814525


Find on

World Cat

OpenLibrary

Internet Archive


This page has been accessed 5 times.
Asian Research Index Whatsapp Chanel
Asian Research Index Whatsapp Chanel

Join our Whatsapp Channel to get regular updates.

Citation Options
Download Citation

Showing 1 to 20 of 51 entries
Chapters/HeadingsAuthor(s)PagesInfo
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 51 entries