Home > Materials, processes, integration and reliability in advanced interconects for micro- and nanoelectronics: symposium held April 10-12, 2007, San Francisco, California, U. S. A. /
Materials, processes, integration and reliability in advanced interconects for micro- and nanoelectronics: symposium held April 10-12, 2007, San Francisco, California, U. S. A. /
Book Informaton
Author
Lin, Qinghuang,
Series
Materials Research Society symposium proceedings,
Volume
v. 990
Year of Publication
c2007.
Publisher
Materials Research Society,
City of Publication
United States
Pages
338
Language
en
ISBN
9781558999503, 1558999507
ARI Id
1675693814525
This page has been accessed 5 times.
Citation Options
Download CitationShowing 1 to 20 of 51 entries
Chapters/Headings | Author(s) | Pages | Info |
Chapters/Headings | Author(s) | Pages | Info |
Showing 1 to 20 of 51 entries