Home > Testing, reliability, and application of micro- and nano-material systems II: 15-17 March, 2004, San Diego, California, USA /
Testing, reliability, and application of micro- and nano-material systems II: 15-17 March, 2004, San Diego, California, USA /
Book Informaton
Author
Meyendorf, Norbert.; Baaklini, George Y.; Michel, Bernd,
Series
SPIE proceedings series;
Volume
v. 5392
Year of Publication
[2004], ©2004.
Publisher
SPIE,
City of Publication
Bellingham, Wash
Pages
272
Language
en
ISBN
0819453099
ARI Id
1675848204507
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