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Home > Testing, reliability, and application of micro- and nano-material systems II: 15-17 March, 2004, San Diego, California, USA /

Testing, reliability, and application of micro- and nano-material systems II: 15-17 March, 2004, San Diego, California, USA /


Book Informaton

Testing, reliability, and application of micro- and nano-material systems II: 15-17 March, 2004, San Diego, California, USA /

Author

Meyendorf, Norbert.; Baaklini, George Y.; Michel, Bernd,

Series

SPIE proceedings series;

Volume

v. 5392

Year of Publication

[2004], ©2004.

Publisher

SPIE,

City of Publication

Bellingham, Wash

Pages

272

Language

en

ISBN

0819453099

ARI Id

1675848204507


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