Search from the table of contents of 2.5 million books
Advanced Search (Beta)
Home > Reliability, testing, and characterization of MEMS/MOEMS II: 27-29 January 2003, San Jose, California, USA /

Reliability, testing, and characterization of MEMS/MOEMS II: 27-29 January 2003, San Jose, California, USA /


Book Informaton

Reliability, testing, and characterization of MEMS/MOEMS II: 27-29 January 2003, San Jose, California, USA /

Author

Ramesham, Rajeshuni.; Tanner, Danelle Mary,

Series

SPIE proceedings series,

Volume

v. 4980

Year of Publication

[2003], ©2003.

Publisher

SPIE,

City of Publication

Bellingham, Wash., USA

Pages

334

Language

en

ISBN

0819447803

ARI Id

1676014736310


Find on

World Cat

OpenLibrary

Internet Archive


This page has been accessed 4 times.
Asian Research Index Whatsapp Chanel
Asian Research Index Whatsapp Chanel

Join our Whatsapp Channel to get regular updates.

Citation Options
Download Citation

Showing 1 to 20 of 38 entries
Chapters/HeadingsAuthor(s)PagesInfo
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 38 entries