Chapter: Using the SEEM Software for Laser SET Testing and Analysis

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Home > Radiation Effects on Embedded Systems > Using the SEEM Software for Laser SET Testing and Analysis

Radiation Effects on Embedded Systems |

Raoul Velazco; Pascal Fouillat; Ricardo Reis

Springer Netherlands

Using the SEEM Software for Laser SET Testing and Analysis

Chapter Info

Authors

Vincent Pouget; Pascal Fouillat; Dean Lewis

ARI Id

1664026669434_639200

Access

Not Available Free

Pages

259-268

DOI

10.1007/978-1-4020-5646-8_12

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4020-5646-8_12

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Chapters/Headings	Author(s)	Pages	Info
Front Matter		I-VIII
Radiation Space Environment	Jean-Claude Boudenot	1-9
Radiation Effects in Microelectronics	R. D. Schrimpf	11-29
In-flight Anomalies on Electronic Devices	Robert Ecoffet	31-68
Multi-level Fault Effects Evaluation	L. Anghel; M. Rebaudengo; M. Sonza Reorda; M. Violante	69-88
Effects of Radiation on Analog and Mixed-Signal Circuits	Marcelo Lubaszewski; Tiago Balen; Erik Schuler; Luigi Carro; Jose Luis Huertas	89-119
Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing	Pascal Fouillat; Vincent Pouget; Dale McMorrow; Frédéric Darracq; Stephen Buchner; Dean LEWIS	121-141
Design Hardening Methodologies for ASICs	Federico Faccio	143-160
Fault Tolerance in Programmable Circuits	Fernanda Lima Kastensmidt; Ricardo Reis	161-181
Automatic Tools for Design Hardening	Celia López-Ongil; Luis Entrena; Mario García-Valderas; Marta Portela-García	183-200
Test Facilities for SEE and Dose Testing	S. Duzellier; G. Berger	201-232
Error Rate Prediction of Digital Architectures: Test Methodology and Tools	Raoul Velazco; Fabien Faure	233-258
Using the SEEM Software for Laser SET Testing and Analysis	Vincent Pouget; Pascal Fouillat; Dean Lewis	259-268
Back Matter		269-269
Chapters/Headings	Author(s)	Pages	Info

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