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Home > Electron Backscatter Diffraction in Materials Science > Structure-Properties Relations: EBSD-Based Material-Sensitive Design
Electron Backscatter Diffraction in Materials Science |
Adam J. Schwartz; Mukul Kumar; Brent L. Adams; David P. Field
Springer US
Electron Backscatter Diffraction in Materials Science
Structure-Properties Relations: EBSD-Based Material-Sensitive Design
Authors

Brent L. Adams; Ben Henrie; Larry Howell; Richard Balling

ARI Id

1664390388569_1478435

Access

Not Available Free

Pages

171-180

DOI

10.1007/978-1-4757-3205-4_15

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4757-3205-4_15

Table of Contents of Book
Showing 1 to 20 of 27 entries
Chapters/HeadingsAuthor(s)PagesInfo
Front Matter
i-xvi
The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy
David J. Dingley
1-18
Theoretical Framework for Electron Backscatter Diffraction
Valerie Randle
19-30
Representations of Texture in Orientation Space
Krishna Rajan
31-38
Rodrigues-Frank Representations of Crystallographic Texture
Krishna Rajan
39-50
Fundamentals of Automated EBSD
Stuart I. Wright
51-64
Studies on the Accuracy of Electron Backscatter Diffraction Measurements
Melik C. Demirel; Bassem S. El-Dasher; Brent L. Adams; Anthony D. Rollett
65-74
Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope
Joseph R. Michael
75-89
Three-Dimensional Orientation Imaging
Dorte Juul Jensen
91-104
Automated Electron Backscatter Diffraction: Present State and Prospects
Robert A. Schwarzer
105-122
EBSD: Buying a System
Alwyn Eades
123-126
Hardware and Software Optimization for Orientation Mapping and Phase Identification
Patrick P. Camus
127-134
An Automated EBSD Acquisition and Processing System
Pierre Rolland; Keith G. Dicks
135-140
Advanced Software Capabilities for Automated EBSD
Stuart I. Wright; David P. Field; David J. Dingley
141-152
Strategies for Analyzing EBSD Datasets
Wayne E. King; James S. Stölken; Mukul Kumar; Adam J. Schwartz
153-170
Structure-Properties Relations: EBSD-Based Material-Sensitive Design
Brent L. Adams; Ben Henrie; Larry Howell; Richard Balling
171-180
Use of EBSD Data in Mesoscale Numerical Analyses
Richard Becker; Hasso Weiland
181-198
Characterization of Deformed Microstructures
David P. Field; Hasso Weiland
199-212
Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium
John F. Bingert; Thomas A. Mason; George C. Kaschner; Paul J. Maudlin; George T. Gray III
213-229
Measuring Strains Using Electron Backscatter Diffraction
Angus J. Wilkinson
231-246
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 27 entries
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