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Home > Modern Developments and Applications in Microbeam Analysis > Surface Characterisation and Modification of YBCO Thin Films by STM

Modern Developments and Applications in Microbeam Analysis |
Springer Vienna
Modern Developments and Applications in Microbeam Analysis

Surface Characterisation and Modification of YBCO Thin Films by STM
Authors

ARI Id

1664426814653_1628167

Access

Not Available Free

Pages

101-107

DOI

10.1007/978-3-7091-7506-4_15

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-7091-7506-4_15

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