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Home > Nano-Net: 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009, Proceedings > Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
Nano-Net: 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009, Proceedings |
Alexandre Schmid; Sanjay Goel; Wei Wang; Valeriu Beiu; Sandro Carrara
Springer Berlin Heidelberg
Nano-Net: 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009, Proceedings
Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
Authors

Milos Stanisavljevic; Alexandre Schmid; Yusuf Leblebici

ARI Id

1664472810050_1829129

Access

Not Available Free

Pages

70-75

DOI

10.1007/978-3-642-04850-0_11

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-642-04850-0_11

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