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Home > MEMS and Nanotechnology, Volume 4: Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics > Analysis of Spherical Indentation of an Elastic Bilayer Using a Modified Perturbation Approach
MEMS and Nanotechnology, Volume 4: Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics |
Tom Proulx
Springer New York
MEMS and Nanotechnology, Volume 4: Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Analysis of Spherical Indentation of an Elastic Bilayer Using a Modified Perturbation Approach
Authors

Jae Hun Kim; Andrew Gouldstone; Chad S. Korach

ARI Id

1664594727834_2343495

Access

Not Available Free

Pages

53-57

DOI

10.1007/978-1-4614-0210-7_8

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4614-0210-7_8

Table of Contents of Book
Showing 1 to 20 of 29 entries
Chapters/HeadingsAuthor(s)PagesInfo
Front Matter
i-viii
Integrated process feasibility of hard-mask for tight pitch interconnects fabrication
Chun-Jen Weng
1-7
Thermoelectric Effects in Current Induced Crystallization of Silicon Microstructures
Gokhan Bakan; Niaz Khan; Helena Silva; Ali Gokirmak
9-16
Evaluation of Resistance Measurement Techniques in Carbon Black and Carbon Nano-tubes Reinforced Epoxy
Venkat K. Vadlamani; Vijaya B. Chalivendra; Arun Shukla; Sze Yang
17-23
A nano-tensile tester for creep studies
L. I. J. C. Bergers; J. P. M. Hoefnagels; E. C. A. Dekkers; M. G. D. Geers
25-29
The Measurement of Cyclic Creep Behavior in Copper Thin Film Using Microtensile Testing
K.-S. Hsu; M.-T. Lin; C.-J. Tong
31-38
New Insight into Pile-up in Thin Film Indentation
B. C. Prorok; B. Frye; B. Zhou; K. Schwieker
39-43
Measuring Substrate-Independent Young’s Modulus of Thin Films
Jennifer Hay
45-51
Analysis of Spherical Indentation of an Elastic Bilayer Using a Modified Perturbation Approach
Jae Hun Kim; Andrew Gouldstone; Chad S. Korach
53-57
Nano-indentation Studies of Polyglactin 910 Monofilament Sutures
Leming Sun; Vijaya Chalivendra; Paul Calvert
59-64
Analytical approach for the determination of nanomechanical properties for metals
Kaushal K Jha; Nakin Suksawang; Arvind Agarwal
65-73
Advances in Thin Film Indentation
B. Zhou; K. Schwieker; B. Frye; B. C. Prorok
75-81
Cyclic Nanoindentation Shakedown of Muscovite and Its Elastic Modulus Measurement
Hang Yin; Guoping Zhang
83-92
Assessment of Digital Holography for 3D-Shape Measurement of Micro Deep Drawing Parts in comparison to Confocal Microscopy
Nan Wang; Claas Falldorf; Christoph von Kopylow; Ralf B. Bergmann
93-98
Full-Field Bulge Testing Using Global Digital Image Correlation
Jan Neggers; Johan Hoefnagels; François Hild; Stéphane Roux; Marc Geers
99-103
Experimental Investigation of Deformation Mechanisms Present in Ultrafine-Grained Metals
Adam Kammers; Samantha Daly
105-110
Characterization of a Variation on AFIT’s Tunable MEMS Cantilever Array Metamaterial
Matthew E. Jussaume; Peter J. Collins; Ronald A. Coutu Jr.
111-118
MEMS for real-time infrared imaging
I. Dobrev; Marc Balboa; Ryan Fossett; C. Furlong; E. J. Harrington
119-124
New Insights into Enhancing Microcantilever MEMS Sensors
S. Morshed; B. C. Prorok
125-130
A Miniature MRI-Compatible Fiber-optic Force Sensor Utilizing Fabry-Perot Interferometer
Hao Su; Michael Zervas; Cosme Furlong; Gregory S. Fischer
131-136
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 29 entries
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