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Progress in Pattern Recognition, Image Analysis and Applications: 10th Iberoamerican Congress on Pattern Recognition, CIARP 2005, Havana, Cuba, November 15-18, 2005, Proceedings |
Springer Berlin Heidelberg
Progress in Pattern Recognition, Image Analysis and Applications: 10th Iberoamerican Congress on Pattern Recognition, CIARP 2005, Havana, Cuba, November 15-18, 2005, Proceedings

Adapted Wavelets for Pattern Detection
Authors

ARI Id

1664699043045_2784103

Access

Not Available Free

Pages

933-944

DOI

10.1007/11578079_96

Chapter URL

https://rd.springer.com/chapter/10.1007/11578079_96

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