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Home > Picosecond Phenomena III: Proceedings of the Third International Conference on Picosecond Phenomena Garmisch-Partenkirchen, Fed. Rep. of Germany June 16–18, 1982 > Electrical Transient Sampling System with Two Picosecond Resolution
Picosecond Phenomena III: Proceedings of the Third International Conference on Picosecond Phenomena Garmisch-Partenkirchen, Fed. Rep. of Germany June 16–18, 1982 |
K.B. Eisenthal; R.M. Hochstrasser; W. Kaiser; A. Laubereau
Springer Berlin Heidelberg
Picosecond Phenomena III: Proceedings of the Third International Conference on Picosecond Phenomena Garmisch-Partenkirchen, Fed. Rep. of Germany June 16–18, 1982
Electrical Transient Sampling System with Two Picosecond Resolution
Authors

J. A. Valdmanis; G. Mourou; C. W. Gabel

ARI Id

1664746889631_3047584

Access

Not Available Free

Pages

101-102

DOI

10.1007/978-3-642-87864-0_26

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-642-87864-0_26

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