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Home > Forces in Scanning Probe Methods > Hydrophobic Surface Interactions Studied Using a Novel Force Microscope
Forces in Scanning Probe Methods |
H.-J. Güntherodt; D. Anselmetti; E. Meyer
Springer Netherlands
Forces in Scanning Probe Methods
Hydrophobic Surface Interactions Studied Using a Novel Force Microscope
Authors

S. P. Jarvis; J. B. Pethica

ARI Id

1664758350650_3096624

Access

Not Available Free

Pages

105-112

DOI

10.1007/978-94-011-0049-6_10

Chapter URL

https://rd.springer.com/chapter/10.1007/978-94-011-0049-6_10

Table of Contents of Book
Showing 1 to 20 of 61 entries
Chapters/HeadingsAuthor(s)PagesInfo
Front Matter
i-xiii
The Nanometer Age: Challenge and Chance
H. Rohrer
1-13
Scanning Probe Microscopy Instrumentation
Othmar Marti; Jaime Colchero
15-34
Low Temperature Scanning Force Microscopy
H. J. Hug; A. Moser; O. Fritz; B. Stiefel; I. Parashikov
35-62
Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope
A. S. Hou; F. Ho; D. M. Bloom
63-68
Oscillating String as a Force Sensor in Scanning Force Microscopy
A. Stalder; U. Dürig
69-78
Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy
N. Blanc; J. Brugger; N. F. De Rooij
79-84
Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si
Charles F. Draper; David M. Schaefer; Richard J. Colton; Steven M. Hues
85-90
Nanostethoscopy: A New Mode of Operation of the Atomic Force Microscope
A. Keaton; J. F. Holzrichter; R. Balhorn; W. J. Siekhaus
91-97
A Multi-Test Instrument Based on Scanning Probe Technologies
L. McDonnell; M. Phelan; E. M. Cashell
99-104
Hydrophobic Surface Interactions Studied Using a Novel Force Microscope
S. P. Jarvis; J. B. Pethica
105-112
Imaging Local Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy
Takahito Inoue; Mark J. Jeffery; Hiroshi Yokoyama
113-118
Simultaneous AFM and Local Conductivity Imaging
A. Kulik; C. Wüthrich; G. Gremaud; G. A. D. Briggs
119-122
Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses
J. K. Gimzewski; Ch. Gerber; E. Meyer; R. R. Schlittler
123-131
Forces in Scanning Probe Microscopy
S. Ciraci
133-147
Controlled Motion of Xe Atom on Metal Surfaces
A. Buldum; S. Ciraci; Ş. Erkoç
149-155
Van Der Waals Forces and Probe Geometries for Some Specific Scanning Force Microscopy Studies
N. Garcia; Vu Thien Binh
157-167
Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces
A. L. Shluger; A. L. Rohl; D. H. Gay; R. T. Williams
169-174
Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces
J. A. Harrison; S. B. Sinnott; C. T. White; D. W. Brenner; R. J. Colton
175-181
Simulation of SFM Images of Adsorbed C 60 and C 70 Molecules
Christian Girard; Michel Devel; Alain Dereux; Christian Joachim
183-189
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 61 entries
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