Chapter: Interconnection Resistances

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Home > Models for Large Integrated Circuits > Interconnection Resistances

Models for Large Integrated Circuits |

Patrick DeWilde; Zhen-Qiu Ning

Springer US

Interconnection Resistances

Chapter Info

Authors

Patrick Dewilde; Zhen-Qui Ning

ARI Id

1664796848398_3260589

Access

Not Available Free

Pages

169-184

DOI

10.1007/978-1-4613-1555-1_10

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4613-1555-1_10

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Chapters/Headings	Author(s)	Pages	Info
Front Matter		i-xiii
Introduction	Patrick Dewilde; Zhen-Qui Ning	1-38
Boundary Value Problems in VLSI Modeling	Patrick Dewilde; Zhen-Qui Ning	39-51
Green’s Function for Stratified Media	Patrick Dewilde; Zhen-Qui Ning	53-70
Galerkin Boundary Finite Elements	Patrick Dewilde; Zhen-Qui Ning	71-95
Point Collocation and Further Simplifications	Patrick Dewilde; Zhen-Qui Ning	97-105
Reduced Models	Patrick Dewilde; Zhen-Qui Ning	107-136
Hierarchical Reduced Models	Patrick Dewilde; Zhen-Qui Ning	137-146
On the Modeling of a Short-Channel MOSFET below Threshold	Patrick Dewilde; Zhen-Qui Ning	147-156
Parasitic Capacitances and Their Linear Approximation	Patrick Dewilde; Zhen-Qui Ning	157-167
Interconnection Resistances	Patrick Dewilde; Zhen-Qui Ning	169-184
Hybrid Finite Elements	Patrick Dewilde; Zhen-Qui Ning	185-196
Appendices	Patrick Dewilde; Zhen-Qui Ning	197-214
Back Matter		215-219
Chapters/Headings	Author(s)	Pages	Info

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