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Smart Card Research and Advanced Applications: 15th International Conference, CARDIS 2016, Cannes, France, November 7–9, 2016, Revised Selected Papers |
Springer International Publishing
Smart Card Research and Advanced Applications: 15th International Conference, CARDIS 2016, Cannes, France, November 7–9, 2016, Revised Selected Papers

Reverse Engineering Flash EEPROM Memories Using Scanning Electron Microscopy
Authors

ARI Id

1664818717371_3645016

Access

Not Available Free

Pages

57-72

DOI

10.1007/978-3-319-54669-8_4

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-319-54669-8_4

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Table of Contents of Book
Showing 1 to 17 of 17 entries
Chapters/HeadingsAuthor(s)PagesInfo
I-XII
1-22
23-38
39-56
57-72
73-88
89-104
105-121
122-136
137-155
156-173
174-191
192-208
209-227
228-244
245-264
265-265
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 17 of 17 entries
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