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Home > Noncontact Atomic Force Microscopy: Volume 2 > Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM

Noncontact Atomic Force Microscopy: Volume 2 |
Springer Berlin Heidelberg
Noncontact Atomic Force Microscopy: Volume 2

Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM
Authors

ARI Id

1664820120511_3650849

Access

Not Available Free

Pages

227-249

DOI

10.1007/978-3-642-01495-6_11

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-642-01495-6_11

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