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Home > Noncontact Atomic Force Microscopy: Volume 2 > First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
Noncontact Atomic Force Microscopy: Volume 2 |
Seizo Morita; Franz J. Giessibl; Roland Wiesendanger
Springer Berlin Heidelberg
Noncontact Atomic Force Microscopy: Volume 2
First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
Authors

Cesar Lazo; Hendrik Hölscher; Vasile Caciuc; Stefan Heinze

ARI Id

1664820120511_3650852

Access

Not Available Free

Pages

287-301

DOI

10.1007/978-3-642-01495-6_14

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-642-01495-6_14

Table of Contents of Book
Showing 1 to 20 of 20 entries
Chapters/HeadingsAuthor(s)PagesInfo
Front Matter
1-17
Introduction
Seizo Morita
1-13
Method for Precise Force Measurements
Masayuki Abe; Ken-ichi Morita
15-30
Force Spectroscopy on Semiconductor Surfaces
Oscar Custance; Noriaki Oyabu; Yoshiaki Sugimoto
31-68
Tip–Sample Interactions as a Function of Distance on Insulating Surfaces
Regina Hoffmann
69-94
Force Field Spectroscopy in Three Dimensions
André Schirmeisen; Hendrik Hölscher; Udo D. Schwarz
95-119
Principles and Applications of the qPlus Sensor
Franz J. Giessibl
121-142
Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond
M. Heyde; G. H. Simon; T. König
143-167
Atom Manipulation on Semiconductor Surfaces
Yoshiaki Sugimoto
169-190
Atomic Manipulation on Metal Surfaces
Markus Ternes; Christopher P. Lutz; Andreas J. Heinrich
191-215
Atomic Manipulation on an Insulator Surface
Sabine Hirth; Frank Ostendorf; Michael Reichling
217-226
Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM
Pablo Pou; Pavel Jelínek; Rubén Pérez
227-249
Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces
T. Trevethan; N. Martsinovich; L. Kantorovich; A. L. Shluger
251-273
Magnetic Exchange Force Microscopy
Alexander Schwarz; Uwe Kaiser; Rene Schmidt; Roland Wiesendanger
275-286
First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
Cesar Lazo; Hendrik Hölscher; Vasile Caciuc; Stefan Heinze
287-301
Frequency Modulation Atomic Force Microscopy in Liquids
Kei Kobayashi; Hirofumi Yamada
303-328
Biological Applications of FM-AFM in Liquid Environment
Takeshi Fukuma; Suzanne P. Jarvis
329-345
High-Frequency Low Amplitude Atomic Force Microscopy
Hideki Kawakatsu; Shuhei Nishida; Dai Kobayashi; Kazuhisa Nakagawa; Shigeki Kawai
347-360
Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy
A. Raman; R. Reifenberger; J. Melcher; R. Tung
361-395
Back Matter
1-5
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 20 entries
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