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Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 |
Springer Berlin Heidelberg
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Atomic Force Microscopy in Bioengineering Applications
Authors

ARI Id

1664824798562_3670394

Access

Not Available Free

Pages

397-430

DOI

10.1007/978-3-642-25414-7_15

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-642-25414-7_15

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