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Home > Ultra Low Noise CMOS Image Sensors > Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process

Ultra Low Noise CMOS Image Sensors |
Springer International Publishing
Ultra Low Noise CMOS Image Sensors

Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process
Authors

ARI Id

1665090725022_4785788

Access

Not Available Free

Pages

111-128

DOI

10.1007/978-3-319-68774-2_7

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-319-68774-2_7

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