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VLSI Design and Test for Systems Dependability |
Springer Japan
VLSI Design and Test for Systems Dependability

Design and Development of Electronic Systems for Quality and Dependability
Authors

ARI Id

1665132078233_4969361

Access

Not Available Free

Pages

27-54

DOI

10.1007/978-4-431-56594-9_2

Chapter URL

https://rd.springer.com/chapter/10.1007/978-4-431-56594-9_2

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