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Artificial Intelligence in Education: 20th International Conference, AIED 2019, Chicago, IL, USA, June 25-29, 2019, Proceedings, Part II |
Springer International Publishing
Artificial Intelligence in Education: 20th International Conference, AIED 2019, Chicago, IL, USA, June 25-29, 2019, Proceedings, Part II

Developing a Deep Learning-Based Affect Recognition System for Young Children
Authors

ARI Id

1665198196590_5321577

Access

Not Available Free

Pages

73-78

DOI

10.1007/978-3-030-23207-8_14

Chapter URL

https://rd.springer.com/chapter/10.1007/978-3-030-23207-8_14

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