Home > Artificial Intelligence in Education: 20th International Conference, AIED 2019, Chicago, IL, USA, June 25-29, 2019, Proceedings, Part II > Bayesian Diagnosis Tracing: Application of Procedural Misconceptions in Knowledge Tracing
Artificial Intelligence in Education: 20th International Conference, AIED 2019, Chicago, IL, USA, June 25-29, 2019, Proceedings, Part II |
Springer International Publishing
Bayesian Diagnosis Tracing: Application of Procedural Misconceptions in Knowledge Tracing
Chapter Info
Authors
ARI Id
1665198196590_5321579
Access
Not Available Free
Pages
84-88
DOI
Chapter URL
https://rd.springer.com/chapter/10.1007/978-3-030-23207-8_16
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