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Home > Microscopy of Semiconducting Materials 2003 > Simulations of the electrostatic potential distribution in a TEM sample of a semiconductor device

Microscopy of Semiconducting Materials 2003 |
Routledge
Microscopy of Semiconducting Materials 2003

Simulations of the electrostatic potential distribution in a TEM sample of a semiconductor device
Authors

ARI Id

1666044653399_14548504

Access

Not Available Free

Pages

501-504

DOI

10.1201/9781351074636-114

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