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Home > Volume 88, Number 2 April 16 > Investigation of the Influence of Deformation on Displacement Lines
Volume 88, Number 2 April 16 |
Görlich
De Gruyter
Volume 88, Number 2 April 16
Investigation of the Influence of Deformation on Displacement Lines
Authors

P. A. Bezirganyan; A. G. Sedrakyan; A. A. Papoyan; K. G. Truni

ARI Id

1666835715935_7900969

Access

Not Available Free

Pages

407

DOI

10.1515/9783112501085-002

Chapter URL

https://www.degruyter.com/document/doi/10.1515/9783112501085-002/html

Table of Contents of Book
Showing 1 to 20 of 71 entries
Chapters/HeadingsAuthor(s)PagesInfo
Frontmatter
I
Classification Scheme
II
Contents
397
Investigation of the Influence of Deformation on Displacement Lines
P. A. Bezirganyan; A. G. Sedrakyan; A. A. Papoyan; K. G. Truni
407
On the Behaviour of GaAs Single Crystals Irradiated with a Free-Running Ruby Laser
I. Ursu; V. Craciun; L. Nanu; Doina Craciun; I . N. Mihailescu; Al. Popa; Ana Pantelica; Maria Salagean
415
Energetic Criterion for the Nucleation of Grains during Grain-Boundary Dissociation
421
Structure of a Second-Order Twin Boundary in Silicon and Its Interaction with Thermally Generated Lattice Dislocations
Fan Van An; N. A. Bulenkov; A. V. Andreeva
429
Electron Microscopy Investigation of Phase Transformations in Mn-Al-C Alloy
A. V. Dobromyslov; A. E. Ermakov; N. I. Taluts; M. A. Uimin
443
Matrix Analog of the Takagi Equations for Grrazing-Incidence Diffraction
M. A. Andreeva; K. Rocete; Yu. P. Khapachev
455
Structure Analysis of the Metallic Glass Fe40Ni40B20 Using the Tangent Lattice Model
A. H. Phillips; A. H. Phillips; N. K. Gobran; R. Kamel
463
Dynamical Effects in Foil Thickness Determination Using Convergent Beam Electron Diffraction
D. E. Jesson; M. P. Shaw
469
A HREM Study of the Crystal Structure of Cu4Ti
J. P. Zhang; H. Q. Ye; K. H. Kuo; S. Amelinckx
475
Long-Period and Hexagonal Shear Domain Structures Co-Existing with the Cu3Ti2 Phase
H. Q. Ye; S. Amelinckx
483
Electrodeposited Tungsten Selenide Films. I. Preparatory Technique and Structural Characterization
S. Chandra; O. N. Srivastava; S. N. Sahu
497
Potentialities of New X-Ray Diffraction Methods in Structural Studies of Ion-Implanted Silicon Layers
A. L. Golovin; R. M. Imamov; E. A. Kondrashkina
505
Electron Density and Work Function Dependence of the Enthalpy of Formation of Metal Oxides
P. J. Pomonis
515
Reversible and Irreversible Processes of Structural Relaxation and Dynamic Young Modulus Behaviour in the Fe40Ni38Mo4B18 Amorphous Alloy
P. Allia; E. Bonetti; E. Evangelista; L. Turroni; F. Vinai
521
Equilibrium Superdislocation Damping in Cu3Au near the Transformation Temperature
K. Miura; A. Maruyama
529
Modelling of Dopant Profiles Modified by Diffusing Defects in Polycrystalline Silicon
E. F. Krimmel; R. Langfeld; A. G. Lutsch
533
The Influence of Growth Rate on the Impurity Cloud Parameters in Pure Silicon
S. E. Zabolotskii; V. P. Kalinusiikin; T. M. Murina; M. G. Ploppa; K. Tempelhoff
539
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 20 of 71 entries
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