Chapter: Topological Testability Conditions for Analog Fault Diagnosis

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Home > Testing and Diagnosis of Analog Circuits and Systems > Topological Testability Conditions for Analog Fault Diagnosis

Testing and Diagnosis of Analog Circuits and Systems |

Ruey-wen Liu

Springer US

Testing and Diagnosis of Analog Circuits and Systems

Topological Testability Conditions for Analog Fault Diagnosis

Chapter Info

Authors

Chen-Shang Lin

ARI Id

1674219679111_2229582

Access

Not Available Free

Pages

65-83

DOI

10.1007/978-1-4615-9747-6_3

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4615-9747-6_3

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Chapters/Headings	Author(s)	Pages	Info
Front Matter		i-xv
A Circuit Theoretic Approach to Analog Fault Diagnosis	Ruey-Wen Liu	1-35
Linear Method vs. Nonlinear Method	T. Matsumoto; Y. Togawa	37-63
Topological Testability Conditions for Analog Fault Diagnosis	Chen-Shang Lin	65-83
Fault Diagnosis of Nonlinear Electronic Circuits	Qiu Huang; Ruey-wen Liu	85-115
Analog Multifrequency Fault Diagnosis with the Assumption of Limited Failures	Ray Decarlo; Lawrence Rapisarda; Mark Wicks	117-145
A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis	Chin-Long Wey	147-186
An Artificial Intelligence Approach to Analog Systems Diagnosis	Frank Pipitone; Kenneth Dejong; William Spears	187-215
Automatic Testing for Control Systems Conformance	Denis R. Towill	217-233
Testing of Analog Integrated Circuits	V. Visvanathan	235-250
A Unified Theory on Test Generation for Analog/Digital Systems	Lang Tong; Ruey-wen Liu	251-279
Back Matter		281-284
Chapters/Headings	Author(s)	Pages	Info

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