Chapter: Automatic Testing for Control Systems Conformance

Click here to donate your five minutes and submit the table of contents of a book.

Search from the table of contents of 2.5 million books

Advanced Search (Beta)

Home > Testing and Diagnosis of Analog Circuits and Systems > Automatic Testing for Control Systems Conformance

Testing and Diagnosis of Analog Circuits and Systems |

Ruey-wen Liu

Springer US

Testing and Diagnosis of Analog Circuits and Systems

Automatic Testing for Control Systems Conformance

Chapter Info

Authors

Denis R. Towill

ARI Id

1674219679111_2229587

Access

Not Available Free

Pages

217-233

DOI

10.1007/978-1-4615-9747-6_8

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4615-9747-6_8

Chapters

entries per page

Filter:

Showing 0 to 0 of 0 entries

Chapter	Author(s)	Book	Book Authors	Year	Publisher
No data available in table
Chapter	Author(s)	Book	Book Authors	Year	Publisher

Showing 0 to 0 of 0 entries

Books

entries per page

Filter:

Showing 0 to 0 of 0 entries

Book	Author(s)	Year	Publisher
No data available in table
Book	Author(s)	Year	Publisher

Showing 0 to 0 of 0 entries

Books

Book	Author(s)	Year	Publisher
Book	Author(s)	Year	Publisher

Articles

entries per page

Filter:

Showing 0 to 0 of 0 entries

Article Title	Authors	Journal	Vol Info	Language
No data available in table
Article Title	Authors	Journal	Vol Info	Language

Showing 0 to 0 of 0 entries

Articles

entries per page

Filter:

Showing 0 to 0 of 0 entries

Heading	Article Title	Authors	Journal	Vol Info
No data available in table
Heading	Article Title	Authors	Journal	Vol Info

Showing 0 to 0 of 0 entries

Articles

entries per page

Filter:

Showing 0 to 0 of 0 entries

Title	Author	Supervisor	Degree	Institute
No data available in table
Title	Author	Supervisor	Degree	Institute

Showing 0 to 0 of 0 entries

Table of Contents of Book

entries per page

Filter:

Showing 1 to 12 of 12 entries

Chapters/Headings	Author(s)	Pages	Info
Front Matter		i-xv
A Circuit Theoretic Approach to Analog Fault Diagnosis	Ruey-Wen Liu	1-35
Linear Method vs. Nonlinear Method	T. Matsumoto; Y. Togawa	37-63
Topological Testability Conditions for Analog Fault Diagnosis	Chen-Shang Lin	65-83
Fault Diagnosis of Nonlinear Electronic Circuits	Qiu Huang; Ruey-wen Liu	85-115
Analog Multifrequency Fault Diagnosis with the Assumption of Limited Failures	Ray Decarlo; Lawrence Rapisarda; Mark Wicks	117-145
A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis	Chin-Long Wey	147-186
An Artificial Intelligence Approach to Analog Systems Diagnosis	Frank Pipitone; Kenneth Dejong; William Spears	187-215
Automatic Testing for Control Systems Conformance	Denis R. Towill	217-233
Testing of Analog Integrated Circuits	V. Visvanathan	235-250
A Unified Theory on Test Generation for Analog/Digital Systems	Lang Tong; Ruey-wen Liu	251-279
Back Matter		281-284
Chapters/Headings	Author(s)	Pages	Info

Showing 1 to 12 of 12 entries

Similar Books

entries per page

Filter:

Showing 0 to 0 of 0 entries

Book	Author(s)	Year	Publisher
No data available in table
Book	Author(s)	Year	Publisher

Showing 0 to 0 of 0 entries

Similar Chapters

entries per page

Filter:

Showing 0 to 0 of 0 entries

Chapter	Author(s)	Book	Book Authors	Year	Publisher
No data available in table
Chapter	Author(s)	Book	Book Authors	Year	Publisher

Showing 0 to 0 of 0 entries

Similar Thesis

entries per page

Filter:

Showing 0 to 0 of 0 entries

Title	Author	Supervisor	Degree	Institute
No data available in table
Title	Author	Supervisor	Degree	Institute

Showing 0 to 0 of 0 entries

Similar News

entries per page

Filter:

Showing 0 to 0 of 0 entries

Headline	Date	News Paper	Country
No data available in table
Headline	Date	News Paper	Country

Showing 0 to 0 of 0 entries