Home > 2nd International Multidisciplinary Microscopy and Microanalysis Congress: Proceedings of InterM, October 16-19, 2014 > TEM Characterization of a Complex Twinning System in 3C–SiC
2nd International Multidisciplinary Microscopy and Microanalysis Congress: Proceedings of InterM, October 16-19, 2014 |
Springer International Publishing
TEM Characterization of a Complex Twinning System in 3C–SiC
Chapter Info
Authors
ARI Id
1674219788077_3382311
Access
Not Available Free
Pages
25-29
DOI
Chapter URL
Table of Contents of Book
Chapters/Headings | Author(s) | Pages | Info |
Loading... | |||
Chapters/Headings | Author(s) | Pages | Info |
Similar Books
Loading...
Similar Chapters
Loading...
Similar Thesis
Loading...
Similar News
Loading...
Similar Articles
Loading...
Similar Article Headings
Loading...