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Home > Surface and Interface Characterization by Electron Optical Methods > Localised Surface Imaging and Spectroscopy in the Scanning Transmission Electron Microscope

Surface and Interface Characterization by Electron Optical Methods |
Springer US
Surface and Interface Characterization by Electron Optical Methods

Localised Surface Imaging and Spectroscopy in the Scanning Transmission Electron Microscope
Authors

ARI Id

1674219952553_4268445

Access

Not Available Free

Pages

19-29

DOI

10.1007/978-1-4615-9537-3_3

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4615-9537-3_3

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