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Home > Surface and Interface Characterization by Electron Optical Methods > Fundamentals of High Resolution Transmission Electron Microscopy

Surface and Interface Characterization by Electron Optical Methods |
Springer US
Surface and Interface Characterization by Electron Optical Methods

Fundamentals of High Resolution Transmission Electron Microscopy
Authors

ARI Id

1674219952553_4268446

Access

Not Available Free

Pages

31-42

DOI

10.1007/978-1-4615-9537-3_4

Chapter URL

https://rd.springer.com/chapter/10.1007/978-1-4615-9537-3_4

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Table of Contents of Book
Showing 1 to 18 of 18 entries
Chapters/HeadingsAuthor(s)PagesInfo
i-viii
1-9
11-18
19-29
31-42
43-54
55-76
77-88
89-125
127-158
159-184
185-193
195-233
235-266
267-283
285-299
301-313
315-319
Chapters/HeadingsAuthor(s)PagesInfo
Showing 1 to 18 of 18 entries
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